DesignCon 2021

Chuck Martin, editorial director at Informa Tech, talks to Josh Builta, AI & IoT research director at Omdia

DesignCon 2021: Combining AI and IoT leads to greater impacts DesignCon 2021: Combining AI and IoT leads to greater impacts

Sep 7, 2021

Senior Omdia analyst Paul Pickering talks to Chuck Martin, editorial director at Informa Tech

DesignCon 2021: A snapshot of the power semiconductor market DesignCon 2021: A snapshot of the power semiconductor market

Sep 7, 2021

All DesignCon 2021

Chuck Martin, editorial director at Informa Tech, talks to Michael Yang, semiconductor analyst from Omdia

DesignCon 2021: The global chip shortage – cause and effect

DesignCon 2021: The global chip shortage – cause and effect

VSI Labs president Phil Magney shows Chuck Martin talks to editorial director at Informa Tech Chuck Martin

DesignCon 2021: An in-depth look at an autonomous test vehicle

DesignCon 2021: An in-depth look at an autonomous test vehicle

Chuck Martin, editorial director at Informa Tech, talks to Omdia senior principal analyst Lee Ratliff

DesignCon 2021: Connectivity’s rapid growth as wireless reliability matures

DesignCon 2021: Connectivity’s rapid growth as wireless reliability matures

Chuck Martin, editorial director at Informa Tech, tals to AEye product management director Indu Vijayan

DesignCon 2021: Autonomous vehicles on the horizon

DesignCon 2021: Autonomous vehicles on the horizon

Chuck Martin, editorial director at Informa Tech, talks with Lang Lin from Ansys

DesignCon 2021: Embedding security design into chips

DesignCon 2021: Embedding security design into chips

DesignCon 2021: Interconnection affection and the 5G explosion

DesignCon 2021: Interconnection affection and the 5G explosion

Chuck Martin, editorial director at Informa Tech, talks to Broadcom director and engineer Cathy Li

DesignCon 2021: The rapid rise of high-speed I/O

DesignCon 2021: The rapid rise of high-speed I/O

Chuck Martin, editorial director at Informa Tech, talks to Sang Oh, senior research analyst from Omdia

DesignCon 2021: COVID not entirely to blame for putting the brakes on the auto industry

DesignCon 2021: COVID not entirely to blame for putting the brakes on the auto industry

Chuck Martin, editorial director at Informa Tech, talks to Ansys director Richard Goldman

DesignCon 2021: Securing semiconductor supply chains more important than where they’re built

DesignCon 2021: Securing semiconductor supply chains more important than where they’re built

Chuck Martin talks to Senior Intel engineer Mike Lee

DesignCon 2021: AI essential to drive chip speeds for next-gen devices

DesignCon 2021: AI essential to drive chip speeds for next-gen devices

DesignCon 2021: Chuck Martin talks to Federico Centola, electro-magnetic compatibility engineer at Google

DesignCon 2021: Why Google needs electro-magnetic compatibility engineers

DesignCon 2021: Why Google needs electro-magnetic compatibility engineers

DesignCon 2021: Omdia’s Jonathan Cassell on AI in semiconductor design

DesignCon 2021: Omdia’s Jonathan Cassell on AI in semiconductor design

DesignCon 2021: Omdia’s Jonathan Cassell on AI in semiconductor design

DesignCon 2021: Chuck Martin from Informa Tech talks to Robert Day director for autonomous vehicles at Arm

DesignCon 2021: Why Arm believes in autonomous vehicles

DesignCon 2021: Why Arm believes in autonomous vehicles

DesignCon 2021: Medicine of the future with Mayo Clinic’s Mark Wehde

DesignCon 2021: Medicine of the future with Mayo Clinic’s Mark Wehde

Chuck Martin and Jenalea Howell from Informa Tech on DesignCon 2021: Back on the road

DesignCon 2021: Back on the road

DesignCon 2021: Back on the road

Jenalea Howell from Informa Tech discuss the growing influence of the automotive industry

DesignCon 2021: Conversations from the show floor

DesignCon 2021: Conversations from the show floor

Making chips for Samsung with Max Min

DesignCon 2021: Making chips for Samsung

DesignCon 2021: Making chips for Samsung

DesignCon 2021: It’s good to be back

DesignCon 2021: It’s good to be back

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